끊임없이 도전하고 노력하는 기업

Probe Station Technology


Process


[1] EPI Growth - General Process
[1] EPI Growth - General Process
[2] Probing - General PL
[2] Probing - General PL
[3] Flip Chip Fabrication - General Process
[3] Flip Chip Fabrication - General Process
[4] wafer Level Multi-Probing - [ X-Prober ]
[4] wafer Level Multi-Probing - [ X-Prober ]

[5] 1st Selective multi Transfer - Laser Lift-off to Backplane - Defective chips can be excluded by information of X-prober

[6] 2nd Selective single Transfer - Laser Lift-off to Backplane Good die can be selected and transfer by the information of x-prober


“Taking this material out of the company without the authorization can be subject to restriction by the sales secret protection law.”


SERVICE

Tel.  031-278-6473

Fax. 031-278-6474

Email. nanoex@nanoex.co.kr
Address. 경기도 수원시 권선구 산업로 190

190, Saneop-ro, Gwonseon-gu, Suwon-si, Gyeonggi-do, Republic of Korea


CopyRight (c) (주)나노엑스. ALL RIGHTS RESERVED.